Texas Instruments released a new ultra-high-speed analog-to-digital converter (ADC) with the widest bandwidth, fastest sampling rate and lowest power consumption. The ADC12DJ5200RF helps engineers in achieving high measurement accuracy for 5G testing applications and oscilloscopes, and direct X-band sampling for radar applications. The ADC is fastest 12-bit ADC in dual channel mode and samples at 5.2 gigasamples per second (GSPS) with capturing instantaneous bandwidth (IBW) as high as 2.6 GHz at 12-bit resolution.
The efficient interface of ADC12DJ5200RF supports the JESD204C standard interface which helps minimize the number of serializer/deserializer lanes needed to output data to field-programmable gate arrays (FPGAs), enabling designers to achieve higher data rates. The ADC12DJ5200RF offers highest signal detection sensitivity across power-supply variations, even at minimum specifications, which improves signal intelligence by providing ultra-high receiver sensitivity to detect even the smallest and weakest signals. TI’s new ultra-high-speed ADC greatly increases measurement accuracy minimizing system errors with offset error as low as ±300 µV and zero temperature drift.
The ADC12DJ5200RF comes with extremely low code error rate (CER) which helps Engineers designing test and measurement equipment and achieving high measurement repeatability. The ADCs are just 10mm by 10mm in size which saves the board space and with reduced number of lanes further leads the PCB design in small size. In terms of power consumption, the ADCs consumes only 4W power which is quite less. For tools and support to speed design, the TI offers the ADC12DJ5200RFEVM and TSW14J57EVM evaluation modules which are available to test the new high-speed ADCs.
The samples of The ADC12DJ5200RF dual- and single-channel ultra-high-speed ADC is available through the TI store in a 144-ball, 10-by-10-mm flip-chip ball grid array (FCBGA) package.